AppNano-AFM
AppNano-AFM 原子力顯微鏡探針
Silicon Probes
Both cantilever & tip are Si
SILICON NITRIDE PROBES
SiN cantilever with Si or SiN tip
ACCESS Tip-View Probes
Allows direct view of the tip as it images the sample
Conductive Probes
Conductive probes for EFM, MFM
QUANTITATIVE FORCE SPECTROSCOPY
Quantitative force spectroscopy
High Aspect Ratio Tip (HART)
Deep trench metrology
STM Products
AppNano also offers high quality STM probes and STM tip etcher.
SICONGG
此款有10支裝、20支裝、50支裝、200支裝、410支-424支裝（wafer）
NITRA-TALL-R-G
常用包裝數量10支裝、20支裝、50支裝
ACCESS-NC-GG
AppNano ACCESS?-NC-GG probes are sharp silicon probes for tapping / non-contact mode applications that allow a direct optical view of the AFM tip and designed for applications that require seeing the tip as it engages the surface. These probes are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high resolution imaging. Reflex and tip sides are coated with gold.