
AppNano-AFM 原子力顯微鏡探針

Both cantilever & tip are Si

SiN cantilever with Si or SiN tip

Allows direct view of the tip as it images the sample

Conductive probes for EFM, MFM

Quantitative force spectroscopy

Deep trench metrology

AppNano also offers high quality STM probes and STM tip etcher.

此款有10支裝、20支裝、50支裝、200支裝、410支-424支裝(wafer)

常用包裝數量10支裝、20支裝、50支裝

AppNano ACCESS?-NC-GG probes are sharp silicon probes for tapping / non-contact mode applications that allow a direct optical view of the AFM tip and designed for applications that require seeing the tip as it engages the surface. These probes are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high resolution imaging. Reflex and tip sides are coated with gold.