DPER 高解析導電探針

Typical radius of uncoated tip : 8 nm
Resulting tip radius with the coating : < 20 nm
Full tip cone angle* : 40°
Total tip height : 12 - 18 µm
Probe material : n-type silicon
Tip coating : Platinum
Detector coating : Platinum

DPER probes are made by depositing a thin platinum coating on silicon tips. While the thickness of the coating on a flat cantilever surface is about 15 nm, there is only a 10 nm increase in the tip dimensions compared to bare silicon probes.
 

APPLICATION

The DPER probes can be used for imaging samples with high resolution in XY directions. Due to the thin coating, the electrical signal may be noisy. One should also not expect coating stability in contact or hard tapping regimes of AFM operation. 


4-CANTILEVERS SERIES

Cantilever Resonance Frequency, kHz Force Constant, N/m
min typical max min typical max
11 series Cantilever A 12 15 18 0.1 0.2 0.4
Cantilever B 60 80 100 1.1 2.7 5.6
Cantilever C 115 155 200 3 7 16
Cantilever D 250 350 465 17 42 90
說明 檔案大小 下載
mikromasch 探針型錄 123KB
型號 概述 詢價數量