Application : Tapping mode. Non-contact mode. Contact mode on hard surfaces. Nanoindentation. Force nanolithography.
ART™ tips are specially grown in CVD process and attached to silicon cantilevers for use in AFM. The probes have high aspect ratio and small tip radius. The probe is highly resistant to wear, which is useful when fast scanning speed is needed, or when the surface contains sharp and rigid edges. Other applications are nanoindention, scratching and nanolithography experiments.