ElectriTap300-G

Application: Tapping,

Intermittent Contact and electric modes such as:

• Scanning Capacitance Microscopy (SCM)

• Electrostatic Force Microscopy (EFM)

• Kelvin Probe Force Microscopy (KPFM)

The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility.

The AFM holder chip fits most commercial AFM systems as it is industry standard size.

Consistent high quality at a lower price!


Coating

Electrically conductive coating of 5 nm Chromium and 25 nm Platinum on both sides of the cantilever. This coating also enhances the laser reflectivity of the cantilever.

AFM Tip

SHAPE
Rotated
HEIGHT
17 µm 
(15 - 19 µm)*
SETBACK
15 µm 
(10 - 20 µm)*
RADIUS
< 25 nm
HALF CONE ANGLE
20°-25° along cantilever axis, 25°-30° from side, 10° at the apex

 

 

AFM Cantilever

Cantilever A
 Beam
 40 N/m (20 - 75 N/m)*
 300 kHz (200 - 400 kHz)*
 125 µm (115 - 135 µm)*
 30 µm (25 - 35 µm)*
 4 µm (3 - 5 µm)*
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型號 概述 詢價數量