Application: Magnetic Force Microscopy (MFM)
Monolithic silicon AFM probe for magnetic force microscopy (MFM). The cobalt alloy coated tip has a magnetic moment of roughly 10^-13 emu and coercivity of roughly 300 Oe.
The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility.
The AFM holder chip fits most commercial AFM systems as it is industry standard size.